Recent Trends in Characterization of Nanoelectronic Materials and Devices with Scanning Probe Microscopy
Speaker : Prof. Guenther Benstetter Affiliation : Deggendorf Institute of Technology, Germany Region : China Year : 2020 Language : English Explore advanced techniques in scanning probe microscopy (SPM) for electronic materials and devices integration. Delve into semiconductor characterization, surface engineering, and material manipulation, unraveling the role of SPM in nanoelectronics.
