Park Knowledge Portal

Speaker : Prof. Sean Joseph O'Shea Affiliation : A*STAR, Singapore Region : China Year : 2020 Language : English Explore the pioneering journey of Conductive Atomic Force Microscopy (C-AFM) from its inception in the 90s to its current applications in nanoelectronics. This dialogue delves into C-AFM's evolution, challenges, and pivotal contributions to nanoscale characterization, offering insights into tip technologies, experimental methodologies, and future prospects in the field.