Few Layer Graphene
Few-layer graphene (FLG) thin film with nanoscale surface texture and heterogeneous electrical/tribological properties, suitable for simultaneous structural, frictional, and conductive characterization.
The surface was characterized using multiple AFM modalities, where Non-contact mode provided high-resolution topography, Lateral Force Microscopy revealed friction contrast, Torsional Force Microscopy enhanced shear sensitivity, and Conductive AFM mapped local electrical conduction pathways.
Scan Conditions
- System: NX20
- Scan Mode: Non-contact, LFM, C-AFM, TFM
- Scan Size: 250 nm×250 nm
- Scan Rate: 2 Hz, 20 Hz, 2.2 Hz
- Pixels: 512×512
- Cantilever: Various Probes
Application
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