Politecnico di Milano, in cooperation with Park Systems and Gambetti Kenologia, is proud to invite researchers to the 2022 AFM Workshop on “Advanced micro and nano characterization of hybrid interfaces - A multidisciplinary approach” with a special demonstration of the automation of nanoscale imaging process on the most advanced nanotechnological tool, Park FX40 Automatic AFM.

Date: 8 November 2022

Venue: Campus Leonardo, Piazza Leonardo da Vinci, 32, Milano, Italy

The one-day event is free of charge and requires a registration in advance.

Deadline: 1 November 2022

September 16, 2022
9:00 AM - 4:00 PM India Time

This will be a 1-day event that will showcase scientific talks and open discussion for diverse research applications. It aims to bring together leading group of researchers and will be a great networking opportunity. PLUS! Get a chance to experience our Park AFM during the hand-on sessions!

Park Systems le invita asistir al Workshop en Microscopía de Fuerza Atómica.

Fecha :Agosto 26, 2022
Lugar :Instituto de Física, UNAM
Circuito de la Investigación Científica Ciudad Universitaria CP 04510 CDMX, México

We are no longer accepting registration for this event

THE LATE-NIGHT AFM WORKSHOP

Advances in Materials Nanocharacterization and Material Analysis: Exploring the Potential of the Sideband KPFM Mode

Date: 8 March, 2022

Time: 21:00 p.m.

Place: Le forum des microscopies à sonde locale

We will showcase the capabilities of the NX10 Research AFM, and the recently launched Park FX40 Automatic AFM with the innovative automation feature for more efficient nano-investigation, including wide range of nanomechanical, magnetic and electrical material characterization modes with a focus on new generation KPFM mode!

We are no longer accepting registration for this event

Training Workshop on AFM

Atomic Force Microscopy and the latest development

Date: 1 March, 2022

Time: 10:00 a.m.

This training workshop introduces to the attendee basic working principle of AFM, and training on using the Park System AFM machines.

Objectives;
a) To understand the theory of contact, non-contact and tapping mode atomic force microscopy and its application
b) To be trained in standard test and operating an Atomic Force Microscopy system.
c) To interprete the topography and properties of surface of a sample.

We are no longer accepting registration for this event