THE LATE-NIGHT AFM WORKSHOP

Advances in Materials Nanocharacterization and Material Analysis: Exploring the Potential of the Sideband KPFM Mode

Date: 8 March, 2022

Time: 21:00 p.m.

Place: Le forum des microscopies à sonde locale

We will showcase the capabilities of the NX10 Research AFM, and the recently launched Park FX40 Automatic AFM with the innovative automation feature for more efficient nano-investigation, including wide range of nanomechanical, magnetic and electrical material characterization modes with a focus on new generation KPFM mode!

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Training Workshop on AFM

Atomic Force Microscopy and the latest development

Date: 1 March, 2022

Time: 10:00 a.m.

This training workshop introduces to the attendee basic working principle of AFM, and training on using the Park System AFM machines.

Objectives;
a) To understand the theory of contact, non-contact and tapping mode atomic force microscopy and its application
b) To be trained in standard test and operating an Atomic Force Microscopy system.
c) To interprete the topography and properties of surface of a sample.

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New hybrid metrology solutions using advances in automated Atomic Force Microscopy,

SEMICON EUROPA 2021, Munich, Germany

Date: Tuesday, November 16 – Friday, November 19, 2021

Time: 12:00 pm

Place: Neue Messe München, Munich, Germany

Enjoy the lunch snacks and the seminar on: “New hybrid metrology solutions using advances in automated Atomic Force Microscopy,” presented by Haneol Cho, industrial application scientist at Park Systems Europe, every Semicon day at 12:00 pm.

In the 30-minutes presentation, we will be revealing new hybrid nanotechnology techniques that provide a holistic pool of information meeting an even broader range of needs and requirements of semiconductor business like imaging narrow or deep trenches, sidewalls, undercuts, layer thicknesses, defect review, hot spot detection, or imaging material properties locally, and more!

The LUNCHEON is open to everyone and is FREE of charge.

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Park Systems, Schaefer Romania and Ruđer Bošković Institute are pleased to invite you to a workshop on Advances and Accuracy in Atomic Force Microscopy: Nanocharacterization for Materials Science, which will take place in October, 2020 at Ruđer Bošković Institute.

We will demonstrate advances in nanocharacterization techniques on the Park NX10 AFM during a live demo session.

Date: October, Week 12-16

Place: Ruđer Bošković Institute, Zagreb, Croatia

This workshop is open to everyone and is free of charge.

This is a 1-day Workshop. The exact date will be specified at the beginning of September 2020.

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Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) method used for investigating and mapping magnetic properties of surfaces. It is the ideal technique to image the spatial distribution of magnetic states in a sample. In vacuum, MFM offers improved sensitivity and thus allows for high-resolution magnetic domain imaging.

In various fields of study from material research to biological sciences, MFM is an important tool for detecting nanoscale magnetic domains by measuring the interaction force between a magnetic tip and sample.

• Date: Thursday, October, 1

• Place: Amphitheatre Room, Laboratoire de Physique des Solides • UMR 8502-Campus universitaire-Bât.510 • F-91405 Orsay Cedex

• Time: 9:30-17:30

In this workshop you will learn about the latest advances in magnetic force microscopy, such as

• the newly developed coupled out-of-plane and in-plane magnetic field generator with variable field strengths allowing for maximum flexibility and customized MFM experiments

• advantages of MFM when measuring in vacuum

The workshop is FREE OF CHARGE and open to all interested scientist.

Lunch and workshop dinner are included.

Registrer here.

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