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Anneal Kevlar margarine IndiumTinOxide Ferroelectric Deposition SetpointMode Dopped Gallium_Arsenide Melt dichalcogenide IIT-chennai LiftMode Ni81Fe19 3-hexylthiophene PVAP3HT TungstenDeposition Worcester_Polytechnic_Institute Magnets TransitionMetal StyreneBeads CuParticle ring shape Adhesion 2d_materials AIN Aluminium_Oxide semifluorinated alkane LightEmission Dental BismuthFerrite TemperatureControlledAFM Transparent Polyvinylidene_fluoride Scratch
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256