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AFM’s high nanoscale resolution and high sensitivity can fulfill the highly challenging requirements of nanoscale electrical property characterization. Park AFM provides industrial-quality electrical property detection tools with high productivity to our customers in both research and industry. Allowing users to take highly accurate measurements and complete their work more quickly, these tools can improve efficiency in the workplace and reduce errors, leading to a more profitable, more consistent development and production process. For more information, visit us at booth A18.

  • Event Dates: July 16 – 19, 2018
  • Venue: Marina Bay Sands Convention Centre, Singapore
  • Our location: Booth A18


About the IPFA:

The International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) is Asia’s premier conference dedicated to IC failure analysis and reliability. 2018 marks its 25th edition and every year professionals, academic, suppliers, decision-makers, aspiring authors and world-class speakers congregate to share technology updates and address industry challenges. IPFA 2018 will feature an extensive program which includes:

• Keynotes and Invited Talks

• Tutorials and Workshops

• Exhibition

• Exchange Paper in FA and Reliability

• Art of Failure Analysis Photo Contest


Link: http://www.ipfa-ieee.org/