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You are cordially invited to Diskcon Japan 2012 at the Plaza Industry Ota (PiO) in Tokyo, Japan on June 5th – 6th, 2012. Come and visit Park Systems booth and learn more about our industrial product line. Park will be featuring a wide range of automated AFM products, specially engineered for hard disk industry, from automatic defect review to automated PTR measurements and to undercut and sidewall characterization. Learn about the XE-HDM, our automated industrial XE-series AFM, specially designed for hard disk media and substrate applications. With newly developed features designed for user convenience and safety, the XE-HDM combines the superb performance of the XE-series AFM with the high-throughput capability required by hard disk media manufacturers. Also, discover the XE-3DM, Park Systems’ new 3D AFM, utilizing True Non-Contact mode for the non-destructive sidewall roughness measurement of soft photoresist structures. With its unique tilt head capability, the XE-3DM is a breakthrough in high resolution 3D AFM measurements.