How to choose an AFM probe
EFM/DC-EFM/KPFM
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Adama Innovations, Applied Nano Structures, Inc, BudgetSensors, MikroMasch, Nanosensors™, Nanotools GmbH, Nanoworld AG, NuNano, Olympus Corp., are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The performance of probes ordered from other sources are not guaranteed.
Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||||||||||||||||||||||||||||||
PPP-CONTSCPt | 0.2 | 25 | Nanosensors | ▪ Cantilever for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 |
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NSC36/Cr-Au | 1 2 0.6 |
90 130 65 |
Mikromasch | ▪ Cantilever for EFM/KPFM and bio application ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ 3 cantilevers on a chip |
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NSC14/Cr-Au | 5 | 160 | Mikromasch | ▪ Cantilever for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au |
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PPP-NCSTAu | 7.4 | 160 | Nanosensors | ▪ Cantilever for EFM/KPFM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Au |
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PPP-EFM | 2.8 | 75 | Nanosensors | ▪ Cantilever for DC-EFM/PFM/SCM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 |
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The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
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NSC36/Pt | 1 2 0.6 |
90 130 65 |
MikroMasch | ▪ Cantilever for DC-EFM/PFM ▪ Backside reflective coating (Pt) ▪ Conductive tip for electrical application, coated with Pt |
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ElectriMulti75-G | 3 | 75 | Budget Sensors | ▪ Cantilever for electrical modes(EFM/KPFM/DC-EFM/PFM) ▪ Backside reflective coating (Cr-Pt) ▪ Conductive tip for electrical application, coated with Cr-Pt |
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Rotated Monolithic silicon probe
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SPARK 70 Pt | 2 | 70 | ▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
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SPARK 150 Pt | 18 | 150 | ▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
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SPARK 350 Pt | 42 | 350 | ▪ Probe for KPFM/PFM ▪ Backside reflective coating (Ti-Pt) ▪ Conductive tip for electrical application, coated with Ti-Pt (5 nm Ti, 40 nm Pt) ▪ Typical tip length: 5 - 8 μm ▪ Typical tip radius: ~18 nm |
Request for Quote |