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Trench Inorganic domain_switching Holes FrictionalForceMicroscopy DLaTGS Writing PtfeMembrane Galfenol BaTiO3 Conductive AFM Vanadate PolyStylene dielectric_trench IMT_Bucharest Spain oxide_layer AtomicLayer ReflexLens Wonseok PolycrystallineFerroelectricBCZT Calcite Gold CastIron Foil MultiLayerCeramicCapacitor BTO HDD BiVO4 SiliconCrystal Force-distance DOE FFM CuSubstrate Annealed
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Hair
Scanning Conditions
- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 15μm×15μm
- Scan Rate: 0.3Hz
- Pixel: 512×256