Atomic force microscopy (AFM) is a technique that measures forces between a probe and sample, which can be used not only to measure the topography of surfaces with nanometre scale resolution but to map and manipulate a range of properties which can be addressed via the tip. Here, we touch on but a few of the capabilities of state-of-the-art atomic force microscopy for layered materials research and explore the possibilities to correlate a host of functional properties in one mouse click using our new FX40 automatic AFM. After introducing the working principles of the measurement of topography, electrostatics and mechanical properties using atomic force microscopy, we will then proceed to perform live nanomechanical [1] and Kelvin probe force microscopy (KPFM) [2,3] measurements on transition metal dichalcogenides which have regions of strain due to trapped interfacial contamination. In addition to studying the interplay of strain and work function in these materials, we will highlight how automated tip exchange enables such measurements to be performed in a less laborious and more reproducible manner.
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- 인라인 계측용 원자현미경
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Ellipsometry Accessories
- Surface Inspection Metrology
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Lectures
- How AFM Works
- 전문가 코너
- Analyze Cells
- Programs
- Park AFM Scholarship
- 제품소개
- 연구ᆞ표면분석용 원자현미경
- 인라인 계측용 원자현미경
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- 응용기술
- 고객지원
- 이벤트
- 회사소개
- 러닝센터
- NANOacademy
- Programs
- Resources
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