Explore Park Systems' AFM technology anytime, anywhere. Experience real scan scenarios and results without hardware or delays. Instant, interactive, and hassle-free — see what’s possible today. *SmartSimulator is not the actual Park AFM software, but a simplified simulation that offers a minimized experience of Park Systems’ metrology solutions.
Now you are ready to start! Enjoy your Park Systems outstanding Virtual Demo experience!
Mode
Vision
Scan Config
128 256512 10242048 4096
0.20.511.522.5357102550100
Scan Area
Sample Details
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Region Histogram
Line Profile
Line Histogram
About SmartAnalysis
Park SmartAnalysis™ is an atomic force microscopy image processing and data analysis software for Park AFM. It is the next generation image analytics software with powerful features and newly added automated functions. Park SmartAnalysis enables users to swiftly prepare, analyze and publish their AFM acquired images and measurements.
- - Precise image analysis via multi-layer and line function: roughness statistical values, multiple specific areas of the histogram, etc.
- - Effortless image processing with EZ Flatten producing optimal images
- - High-quality 2D, 3D images, histogram, and region statistics analysis
- - Image export and publishing without degrading the image resolution
Scanned Image
Used Mode
Sample
- Head Mode:
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Analysis Insight
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