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Silver Conductance Dopped SiliconCrystal Polymer PolyimideFilm Ni-FeAlloy HighResolution LiquidImaging OrganicCompound epitaxy self-assembly BFO Fendb Hexacontane Gold Vanadate Grain Implant MultiLayerCeramicCapacitor MLCC PinpointNanomechanicalMode C_AFM SiliconeOxide Heating TemperatureControllerAFM DIWafer PetruPoni Magnets optoelectronics Stiffness SingleLayer Topography InsulatorFilm Change
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Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 1Hz
- Pixel:512×256