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Cobalt-dopedIronOxide flakes SKKU PMNPT Lift 2d_materials PpLdpe Sphere silicon_carbide SelfAssembly Ni81Fe19 Protein Lanthanum_aluminate light_emission Heating Magnetostrictive organic_polymer CntFilm TungstenDeposition Ni-FeAlloy Indent Writing HafniumDioxide Non-ContactMode Jason Optoelectronic ElectroDeposition WS2 EvatecAG AdhesionEnergy PatternedSapphireSubstrat FM_SKPM ForceVolumeMapping molecules Magnetic Force Microscopy
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CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256