-
block_copolymer cannabidiol Oxide OrganicSemiconductor Fendb Yeditepe_University Beads Carbon FM_KPFM EvatecAG cross section ULCA Biofilm Phthalocyanine Hafnia OpticalModulator TungstenThinFilmDeposition Neodymium AAO hard_disk Tape piezoelectric force microscopy FM-KPFM CaMnO3 thermal_conductivity KAIST FailureAnalysis LaAlO3 ElectrostaticForceMicroscopy Lateral_Force_Microscopy FrequencyModulation SelfAssembly DeflectionOptics flakes Al2O3
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
PZT thin film
Scanning Conditions
- System: NX10
- Scan Mode: PFM (DC-EFM)
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 512×512