-
Tungsten SPMLabs Phthalocyanine Defects Gallium_Arsenide Electronics Glass sputter Yttria_stabilized_Zirconia InLiquid KevlarFiber Strontium BismuthFerrite TungstenThinFilmDeposition Water KPFM Phenanthrene align RedBloodCell IISCBangalore ThermalConductivity Hexylthiophene ScanningTunnelingMicroscopy Nanopattern Hydroxyapatite GlassTemperature TemperatureControlledAFM Copper Metal-organicComplex Cobalt contact Etch AM-KPFM Self-assembledMonolayer DiffractiveOpticalElements
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semi-fluorinated alkanes
Scanning Conditions
- System : NX10
- Scan Mode: Sideband KPFM
- Scan Rate : 0.4 Hz
- Scan Size : 500nm×500nm
- Pixel Size : 256×256
- Cantilever : HQ: NSC14/CR-AU (k=5N/m, f=160kHz)