-
Cell nanomechanical Varistor Photovoltaics semifluorinated alkane Polypropylene Defects Platinum Semiconductor FAFailureAnlaysis silicon_carbide CHRYSALIS_INC Fiber Copolymer exfoliate Perovskite Ram Vortex OrganicCompound Sic SmallScan Led Modulus Titanate Microchannel StyreneBeads Temperature PMNPT Domain ElectrostaticForceMicroscopy GlassTemp Polyvinylidene_fluoride tip_bias_mode China Cobalt-dopedIronOxide
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (1/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.25 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 4 Hz
- Scan Size : 2.5μm×2.5μm
- Pixel Size : 512×512
- Cantilever : ContSCPt (k=0.2N/m, f=25kHz)