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Multiferroic_materials UnivOfMaryland FFM ReflexLens PolyvinylideneFluoride 2d_materials KPFM Roughness ring shape SmalScan Conductivity Bio Worcester_Polytechnic_Institute atomic_layer Polyvinylidene_fluoride CopperFoil Kevlar pulsed_laser_deposition Solar Optical Chromium ScanningThermalMicroscopy Inorganic_Compound Mfm CaMnO3 sputter Array Zagreb Yeditepe_University Tapping Jason self_assembly 2-vinylpyridine FrictionForce Phthalocyanine
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Mo film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz, 0.8 Hz
- Scan Size : 5μm2, 15μm2
- Pixel Size : All 1024×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)