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FastScan GaP high_resolution alkanes SiliconCrystal SThM Ceramic Molybdenum InorganicCompound Ceramics CP-AFM GranadaUniv TyphimuriumBiofilm AM-KPFM AAO PVAP3HT GaAs temp_control Friction PFM GlassTemperature ScanningIon-ConductanceMicroscopy ItoGlass ThinFilm IISCBangalore LMF ScratchMode Fe_film oxide_layer Reduction CompactDisk IndiumTinOxide NUSNNI conductive ForceVolume
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Semi-fluorinated alkanes
Scanning Conditions
- System : FX10
- Scan Mode: Non-contact
- Scan Rate : 0.4 Hz
- Scan Size : 3μm×3μm
- Pixel Size : 1024×1024
- Cantilever : HQ: NSC14/CR-AU (k=5N/m, f=160kHz)