-
MfmAmplitude Mapping PS_PVAC Display ContactModeDot CuFoil HighAcpectRatio 2dMaterials ItoGlass INSP Defect HiVacuum MechanicalProperty TempControl Phenanthrene EFMAmplitude CrystalGrowing BismuthFerrite Holes Au111 TCS PtfeFilter Anneal temperature_control CalciumHydroxide Electrical&Electronics Chungnam_National_University silicon_oxide fifber Mechanical conductive PiezoelectricForceMicroscopy SiliconeOxide BaTiO3 Indent
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V