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Sapphire bias_mode temp Film Grain WWafer Polyethylene phase_change MechanicalProperties TappingMode EPFL Lateral_Force_Microscopy AIN TiO2 Defect 2dMaterials Hexylthiophene VerticalPFM temperature_control Change CuParticle ito_film HydroGel plastics Indent Water Fiber LateralPFM StyreneBeads BiVO4 Crystal Calcite AmplitudeModulation PolyStylene Foil
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Kevlar fiber
Scanning Conditions
- System: XE7
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256