Please stop by our booth to learn about microscopic thin film metrology and visualization using Imaging Spectroscopic Ellipsometry!
Attend the talk "Microscopic Characterization of Optical Properties and Film Thickness Using Imaging Spectroscopic Ellipsometry" by Hanaul Noh, senior applications Scientist, on Monday, May 20th, at 4:40 PM in Room Town & Country C.
- Event Dates:
- Tuesday May 21 | 12:00 PM - 7 PM
- Wednesday May 22 | 10 AM - 2 PM
- Venue: Town & Country Resort | San Diego, CA
- Booth: #405
Link: ICMCTF 50th