-
FrictionalForce Lateral_Force_Microscopy hetero_structure Sapphire MagneticForce AmplitudeModulation Temperature fifber 2-vinylpyridine silicon_carbide EFM Step Nanotechnology Al2O3 Fe_film PatternedSapphireSubstrat FrictionalForceMicroscopy CopperFoil CeNSE_IISc YszSubstrate CuParticle MechanicalProperties Temasek_Lab FailureAnlaysis Microchannel Conducting NCM LFM frequency_modulation LogAmplifier domain_switching SKKU TCS SiliconCrystal Mechanical&nanotechnology
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Block copolymer ΙΙ
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm, 0.3μm, 0.1μm
- Scan Rate: 1Hz, 1Hz, 2Hz
- Pixel: 512×512, 256×256, 256×256
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm, 0.3μm, 0.1μm
- Scan Rate: 1Hz, 1Hz, 2Hz
- Pixel: 512×512, 256×256, 256×256