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Wafer TyphimuriumBiofilm SicMosfet CP-AFM Blend Polarization AEAPDES ScratchMode Chemical_Vapor_Deposition Molybdenum SKKU ForceVolumeImage self_assembly Floppy Boundary phase_change LightEmiting Edwin AlkaneFilm fifber FM_KPFM DNA Sic SKPM food Permalloy NiFe amplitude_modulation Collagen HafniumDioxide SThM Oxidation kelvin probe force microscopy Semiconductor InorganicCompound
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BiVO4 on treated YSZ substrate
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.36Hz
- Pixel: 256×256