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SiliconCrystal Conducting India Trench single_layer AEAPDES Co/Cr/Pt plastic Biofilm LiIonBattery Hexatriacontane CNT Phosphide SoftSample nanobar PetruPoni_Institute Conductance IISCBangalore blended polymers molecules HexagonalBN Piranha FFM PVAC dielectric trench PVAP3HT Optoelectronic AIN CastIron KAIST DNA Sadowski FM_SKPM 2-vinylpyridine Lanthanum_aluminate
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V