10th International Conference on Spectroscopic Ellipsometry

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Join us at the 10th International Conference on Spectroscopic Ellipsometry in Boulder, Colorado.


Experience Imaging Spectroscopic Ellipsometry (ISE) spot measurements—delivering micron-level resolution, pixel-by-pixel film property mapping, and real-time contrast enhancement. Ideal applications in 2D materials, photonics, display technologies, and thin-film process monitoring.