-
HACrystal Writing TemperatureControlledAFM DiffractiveOpticalElements Yeditepe_University Current Pyroelectric GranadaUniv Ca10(PO4)6(OH)2 light_emission Pattern Growth Mechinical Vacuum BTO ForceDistanceSpectroscopy Polypropylene Dimethicone Resistance Steps CuSubstrate nanobar Materials Treatment Thermal NUS_NNI_Nanocore Co/Cr/Pt thermal_conductivity Subhajjit HighResolution Blend plastics Leakage Platinum EvatecAG
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac