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China C36H74 Tungsten Polyvinylidene FM_SKPM UTEM Topography Sapphire PvdfBead AtomicSteps Strontium NtuEee Metal Lateral ferromagnetic TyphimuriumBiofilm StainlessSteel Vortex HardDisk MBE temperature_control Nanopattern NCM\ OpticalModulator EPFL 2d_materials Bacteria Holes LateralForce LiftHeight LiquidCrystal mechanical_property thermoplastic_elastomers MolecularSelfAssembly Domain
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256