-
Chungnam_National_University IMT_Bucharest Cobalt CastIron YttriaStabilizedZirconia Hexylthiophene frequency_modulation molecular_self_assembly molecular_beam NiFe P3HT Device CeramicCapacitor AM_KPFM NeodymiumMagnets Yeditepe AtomicSteps CuParticle Oxidation EvatecAG multi_layer hard_disk_media PetruPoni_Institute LiftMode SrO Phenanthrene Molybdenum_disulfide OpticalWaveguides Temasek_Lab MultiferroicMaterials Korea MolybdenumDisulfide LateralForce MLCC FailureAnlaysis
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
PS/LDPE
Scanning Conditions
- System : FX40
- Scan Mode: PinPoint nanomechanical
- Scan Rate : 0.15 Hz
- Scan Size : 50μm×50μm
- Pixel Size : 256×256
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)