-
Kevlar amplitude_modulation block_copolymer Led Lift fluorocarbon Temasek_Lab polymeric_arrays Fe_film Graphite LowDensityPolyethylene HiVacuum Lateral Ni81Fe19 H-BN Fluoride LeakageCurrent Conductivity FloppyDisk Nanotechnology Strontium PvdfFilm temperature_control Growth TipBiasMode blended polymers silicon_carbide Force-distance atomic_layer hard_disk_media Spincast Sic PS_PVAC SiliconeOxide Annealed
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256