-
Spincast GaP Vanadate Al2O3 PVA cross section Optoelectronic LiquidImaging InorganicCompound CP-AFM Piranha temp LifeScience LeakageCurrent HfO2 LDPE neodymium_magnets Singapore fe_nd_b Granada NiFe BTO TungstenDeposition BaTiO3 BCZT mfm_amplitude Lattice SmalScan Cobalt EPFL Indent cannabidiol BlockCopolymer TungstenThinFilmDeposition Adhesive
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126