-
SAM F14H20 Mechinical Boron Varistor Chrome Mechanical Defects Polyaniline HOPG Melt AM-KPFM non_contact Floppy molecules Graphite Global_Comm Ni81Fe19 2d_materials TemperatureControllerAFM Chromium 2dMaterials ferromagnetic IRDetector Piezoresponse Polymer phase_change FM-KPFM Domain SurfaceOxidation UnivCollegeLondon 2-vinylpyridine HighAcpectRatio GaAs Layer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, Failure analysis
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 11μm×11μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Sample bias: -0.5V