|お問い合わせ  Global

scanning-tunneling-spectroscopy-sts

Using a STM tip as a nanometer scale contact, STS spectroscopy provides a plot of the current (I) as a function of the tip bias voltage (V) applied to a sample. In order to investigate the electrical properties of the sample surface, IV spectroscopy is measured on the selected sample area after taking a STM image. The spectroscopy data can be used to study the local electronic state of the sample.

イベント

   August 21 - August 25
   August 21 - August 26
   August 26
   September 6 - September 8
   September 7 - September 9
   September 11 - September 16
   September 19 - September 23
 

Atomic Force Microscopy | AFM Microscope | Park Systems