Park Systems, the preferred nanotechnology solutions partner for the most accurate AFM results, will exhibit at the 2011 APS March Meeting in Dallas, Texas from Mar. 21st to 25th. Please come and visit us at Booth#502 to learn our wide range of research AFM products. We will display the all new XE-100 Plus, the Park Systems’ flagship AFM, with a motorized sample stage for Step-and-Scan Automation and improved drift rates. Also, find out more about the XE-150, our premier cross-functional AFM with motorized sample stage, and the XE-Bio, our new AFM for live cell imaging with Ion Conductance Microscopy (ICM). All the XE-series of products feature artifact free imaging by Crosstalk Elimination (XE), True Non-Contact mode, and the ultimate in AFM resolution.
Latest News
- NanoScientific Symposium 2022 Now Open for Registration 2022年04月26日
- Fraunhofer Institute for Integrated Systems and Device Technology IISB and Park Systems Announce the 2nd International SPM Symposium on Failure Analysis and Material Testing 2022年02月23日
- NanoScientific Magazine, Park Systems Special Edition 2022年01月13日
- パーク・システムズ社、 原子間力顕微鏡と白色光干渉計を組み合わせたパワフルな半導体計測装置を発表 2021年12月07日
- 8月30日付 日刊工業新聞掲載 原子間力顕微鏡(AFM)で成長を続けるグローバルカンパニー 2021年08月30日
Technical Articles
- Park SmartLitho – A Novel Approach for Nanopatterning Using AFM Lithography 2022年06月07日
- Nanomechanical Properties of Lipid Vesicles Using Atomic Force Microscopy 2022年06月07日
- Investigation of cell surface changes due to detergent treatment using scanning ion conductance microscopy (SICM) 2022年06月07日
- Exploring ferroelectricity in layered materials using electrostatic force microscopy in vacuum 2022年04月11日
More inTechnical Articles
イベント
August 21
-
August 25
August 21
-
August 26
August 26
August 30
September 6
-
September 8
September 7
-
September 9
September 11
-
September 16
September 19
-
September 23
September 27
-
September 29