Park NX7 Specifications
Scanner
Z Scanner
Flexure guided high-force scanner
Scan range: 15 µm (optional 30 µm)
XY scanner
Single module flexure XY-scanner with closed-loop control
Scan range : 50 µm × 50 µm
(optional 10 µm × 10 µm or 100 µm × 100 µm)
Stage
XY stage travel range: 13 mm x 13 mm (Manual)
Z stage travel range: 26 mm (Motorized)
Focus stage travel range: 30 mm (Manual)
Sample Mount
Sample size : Up to 50 mm x 50 mm, Thickness Up to 20 mm
On-Axis Optics
Direct on-axis vision of sample surface and cantilever
Field-of-view : 480 × 360 µm (with 10× objective lens)
CCD : 1.2 M pixel, 5 M pixel (optional)
(optional; Field-of-view: 840 µm x 630 µm)
Software
SmartScanTM
- AFM system control and data acquisition software
- Auto mode for quick setup and easy imaging
- Manual mode for advanced use and finer scan control
SmartAnalysisTM
- AFM data analysis software
- Stand-alone design—can install and analyze data away from AFM
- Capable of producing 3D renders of acquired data
Electronics
Integrated functions
4 channels of flexible digital lock-in amplifier
Spring constant calibration (Thermal method)
Digital Q control
Options/Modes
Force Measurement
Dielectric/Piezoelectric Properties
Electric Force Microscopy (EFM)
Piezoresponse Force Microscopy (PFM)
PFM with High Voltage*
Mechanical Properties
Force Modulation Microscopy (FMM)
Nanoindentation
Nanolithography*
Nanolithography with High Voltage*
Nanomanipulation*
Magnetic Properties
Chemical Properties*
Chemical Force Microscopy with Functionalized Tip
Electrochemical Microscopy (EC-AFM)
Accessories*
• Liquid Probehand
• Universal Liquid Cell with Temperature Control
• Temperature Controlled Stage 1, 2 and 3
• Electrochemistry Cell
• High-field Magnetic Field Generator
• Tilting Sample Chuck