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Sample Mounts

The sample mount allows you to place various types of sample for the AFM measurement. It provides easier means to fix and access the sample.

 

Multi Sample Chuck

  • Sample plate to load multiple small samples for automated sequential scanning
  • Up to 16 samples of less than 10 mm × 10 mm, 20 mm thickness each
  • Sample weight: less than 200 g (in total)
 

150-mm Vacuum Sample Chuck

  • Sample size: 2, 4, 6 inch wafers, and up to 10 × 10 mm of arbitrary shape, 20 mm thickness
  • Sample weight: less than 500 g
 

Tilting Sample Chuck

tilting-sample-chuck

  • Sample plate to tilt the sample for sidewall measurements
    - Tilting angle: 10, 15, and 20°
    - Sample size: 20 mm × 20 mm, 2 mm thickness
    - Sample weight: less than 200 g
 

Non-magnetic Sample Holder

  • A sample holder to hold samples on top of the XY scanner using clips
  • Recommended for magnetically sensitive samples and / or configuration
 

Snap-In Sample Chuck

  • Sample chuck to place samples on a repeatable position
  • Positioning repeatability: 5 µm in X and Y direction each
 

Cross-sectional Sample Holder

  • Sample holder to vertically mount a cross-sectioned sample held by a metallic clip
  • Allowable sample thickness: 3 mm max.
 

 

Park AFM Options

Easily customize our AFMs to fit your unique needs

Because all of our AFMs use a modular, easy to modify design, we offer a large selection of options that let you customize your AFM to meet your individual needs. Now you can do better work and waste less time with a Park AFM designed specifically for you.


XY scanners

nx10-XY-Scanner

  • 10µm x 10µm XY Scanner for NX10
  • 50µm x 50µm XY Scanner for NX10
  • 100µm x 100µm XY Scanner for NX10
  • 100µm x 100µm XY Scanner for NX20

Read More


Z scanner heads

Standard-NX-AFM-Head

  • Standard NX AFM Head
  • Long Travel NX AFM Head
  • SICM Head for NX
  • Long Travel SICM Head for NX

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Sample Mounts

  • Multi Sample Chuck
  • 150-mm Vacuum Sample Chuck
  • Tilting Sample Chuck
  • Non-magnetic Sample Holder
  • Snap-In Sample Chuck
  • Cross-sectional Sample Holder

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Park Acoustic Enclosures

AFMs measure properties at the nanometer scale, so every small factor can have a large effect on accuracy. That’s why Park has developed some of the best acoustic enclosures on the market, isolating the instrument from noise and helping to make Park AFMs the world’s most accurate.

NX-Standard-Acoustic-Enclosures

  • Park Acoustic Enclosure 203
  • Park Active Temperature Control for Acoustic Enclosure 203
  • Park Acoustic Enclosure 101
  • Park Acoustic Enclosure 201
  • Park Acoustic Enclosure 204

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Temperature Control

Explore unique phenomena of polymers and biological samples with our selection of temperature control options.

  • Temperature Controlled Stage 1
  • Temperature Controlled Stage 2
  • Temperature Controlled Stage 3

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Environmental Control

Our selection of environmental control units allows you to precisely regulate oxygen content, humidity, CO2 concentration, pH, and temperature. This gives you to the power to insulate highly reactive materials, keep cells alive longer, and do more groundbreaking research.

  • Park NX10 GloveBox
  • Humidity Control System
  • Mbraun Glovebox
  • Live Cell Chamber

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Liquid Cells

Our selection of liquid cells provide an extensive array of options for biological researchers that need to measure samples immersed in an environment controlled liquid environment.

Universal-Liquid-Cell

  • Universal Liquid Cell
  • Electrochemistry Cell
  • Open Liquid Cell

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Probehands

Probehands hold the cantilever connect them to the Z scanner. Our selection for the XE head lets you measure a wide range of features, so you can get the data you need to do your best work.

  • Standard Probehand
  • Clip Type Probehand
  • Liquid Probehand

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Accessories

To make sure you can conduct more varied and specific research and tests, Park offers an array of additional accessories to further customize your AFM.

Signal-Access-Module-XE

  • Signal Access Module
  • External High Voltage Kit
  • Magnetic Field Generator
  • Chip Carriers
  • Non-magnetic Sample Holder

Read More

 

Park NANOstandard

The calibration standard samples for atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurements.

 

Manufactured by Kims Reference Corp.

AFM Tip Characterizer (AFMTC)

AFMTC sample consists of 10 Multiple Narrow Trenches (10 ~ 50 nm) and a 50 nm Isolated Line.
This calibration sample provides users with a certified reference material to evaluate the performance for nanoscale narrow trench measurement and the shape characterization of AFM tips.

Specifications :

Trench widths: 10 nm, 13 nm, 16 nm, 19 nm, 22 nm, 26 nm 30 nm, 35 nm, 40 nm, 50 nm
Line widths: 50 nm
Step height: 100 nm (not certified)
Pattern length: 4.0 mm (certified region: 3 mm from center)
Material: Polycrystalline silicon
Traceability: KOLAS* (KRISS**) traceable via ISO 17034:2016
 

High Magnification Calibrator (HMC)

The HMC sample consists of a set of lines that provides five different width and pitch references.
This calibration sample offers users with a certified reference Nanometric Ruler to calibrate the horizontal scale of AFM measurement or SEM magnification. It also comes with a statistical analysis template (an Excel file), an automatic calculation tool that allows users to obtain the calibration parameters accurately and easily.

Specifications :

Line widths (W1~W5): 5 certified values within 20 nm ~ 80 nm
Pitch values (P1~P5): 5 certified values within 100 nm ~ 900 nm
Step height: 70 nm (not certified)
Pattern length: 4.0 mm (certified region: 3 mm from center)
Material: Polycrystalline silicon
Traceability: KOLAS* (KRISS**) traceable via ISO 17034:2016

Park AFM Accessories

To make sure you can conduct more varied and specific research and tests, Park offers an array of additional accessories to further customize your AFM.

 

Signal Access Module

Access all the input/output signals for your AFM with the Signal Access Module. The unit provides an easy way to get scanner position, cantilever deflection, driving signal, bias, and other data to use to improve the quality of your work.

Signal-Access-Module-NXSignal-Access-Module-XE

[ NX ]  /  [ XE ]

Specifications :

Enables access to various input/output signals for AFM
Scanner driving signal for the XY and Z scanners
Position signal for the XY and Z scanners
Cantilever deflection signals of the vertical/lateral direction
Bias signal for the sample and the cantilever
Driving signal for XE-AFM
Auxiliary input signal to the system
 

NX12 Stand-alone Base

Supporting base for a system utilization without inverted microscope.
NX12 STT

Specifications :

Enables utilizing NX12 system without integration of inverted microscope
Requires active vibration isolation table and acoustic enclosure for optimized system performance
 

External High Voltage Kit

This accessory provides an applied external bias of up to +/-300V.

External-High-Voltage-Kit-NX

[ NX ]

Specifications :

Bias range: +/-300V
Works with Conductive AFM, EFM/KPFM/DC-EFM/PFM, and Nanolithography
 

Magnetic Field Generator

The magnetic field generator lets you apply an external magnetic field to the sample. The field can be changed from -300 gauss to 300 gauss, and is parallel to the sample surface. You can then easily observe changes in the magnetic structure using one of our magnetic force microscopy (MFM) options.

Magnetic-Field-Generator-XE

[ XE ]

Specifications :

Applying external magnetic field parallel to sample surface
Tunable magnetic field
Range: -300 - 300 gauss
Composed of pure iron core & two solenoid cells
 

Chip Carriers

Our chip carriers come in several types depending on your needs. We currently offer:

[ Standard chip carriers ]

[ Mounted type on
ceramic plate
attached chip carrier ]

[ Teflon coated chip
carriers for EC-Cell ]

[ Ceramic chip carriers for SCM ]

[ Ceramic Chip Carrier for SThM ]

Specifications :

Standard chip carriers
Mounted type on ceramic plate attached chip carrier
Teflon coated chip carriers for EC-Cell
Ceramic chip carriers for SCM
Ceramic Chip Carrier for SThM
 

QR Chip Carrier

QR-Chip-Carrier

[ QR Chip Carrier ]

Specifications :

QR chip carriers for FX40
 

NX-3DM chip carrier

Specifications :

3DM chip carriers for NX-3DM
 

Non-magnetic Sample Holder

Ideal for taking delicate MFM measurements, the non-magnetic sample holder prevents interference from the magnetic field of the standard sample holder.

Park Acoustic Enclosures

AFMs measure properties at the nanometer scale, so every small factor can have a large effect on accuracy. That’s why Park has developed some of the best acoustic enclosures on the market, isolating the instrument from noise and helping to make Park AFMs the world’s most accurate.

 

Park Acoustic Enclosure 202

ae202

Specifications :

Environmentally sealed acoustic enclosure to block external acoustic
and light noise
Dimensions: 820 × 920 × 1,360 mm (outer dimension, W x D x H)
Weight: 350 kg
* For NX20
 

Park Acoustic Enclosure 203

The Acoustic Enclosure 203 may come standard with the NX10, but its acoustic isolation performance is anything but. Active vibration isolation, and an ergonomic design make it one of the most effective and easy to use acoustic enclosures on the market.

Acoustic Enclosure 203

Specifications :

Includes an active vibration isolation system for extreme vibration isolation
Ergonomic design for convenient access to the instrument
Dimensions: 700 × 900 × 1,300 mm for NX10
Weight: 300kg for NX10 Standard AE

 

Active Temperature Control for Park Acoustic Enclosure 203

For those that need precise temperature control and incredible acoustic isolation for their NX AFM. This enclosure maintains a thermally stable environment within 10 minutes of activation.

Active-Temperature-Control

Specifications :

- Innovative control design brings the enclosure quickly to its temperature equilibrium
- Temperature variability of less than 0.1°C within 10 minutes of closing the door

 

Park Acoustic Enclosure 101

Our easiest to handle AE, the Acoustic Enclosure 101 weighs just 40 kg, while still effectively isolating your AFM from unwanted noise.

Tabletop-Acoustic-Enclosure

Specifications :

Environmentally sealed acoustic enclosure to block external acoustic and light noise
Ergonomic design for user convenience
Dimension: 510 × 715 × 630 mm (outer dimension, W x D x H)
Weight: 40 kg
 

Park Acoustic Enclosure 201

The Acoustic Enclosure 201 isolates the NX system from external acoustic and light noise for exact precision. The unit can also be equipped with an active vibration isolation table for even better performance.

Acoustic Enclosure 201

Specifications :

Granite table provides increased vibration isolation
Best solution for sub-nanometer scale high resolution imaging
Ergonomic design for a convenient access to the instrument
Dimension: 820 × 920 × 1,345 mm (outer dimension, W x D x H)
* For NX20 Lite

 

 

Park Acoustic Enclosure 204

 

Integrated-Acoustic-Enclosure

Specifications :

Best solution for high resolution in-liquid imaging
Ergonomic design for a convenient access to the instrument
Dimension: 880 × 1,000 × 1,500 mm (outer dimension, W x D x H)
Weight: 385 kg

* For NX12

 

Park Acoustic Enclosure 401

 Acoustic Enclosure 401

Specifications :

Acoustic enclosure designed for industrial environment
Dimension: 880 × 980 × 1,460 mm (outer dimension, W x D x H)
Weight: 595 kg