-
NUS SiWafer Yeditepe_University cooling PatternedSapphireSubstrat thermal_property ForceVolumeMapping Platinum ForceMapping silicon_carbide Mfm MolecularSelfAssembly Tape phase_change Polymer ThermalConductivity Multiferroic_materials IcelandSpar Sapphire thermal_conductivity Polytetrafluoroethylene LiNbO3 Memory SiliconeOxide StrontiuTitanate 3-hexylthiophene Topography LiIonBattery SiliconOxide flakes pulsed_laser_deposition SmalScan PhaseTransition DeoxyribonucleicAcid Ecoli
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polymers
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 1Hz
- Pixel: 512×512