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Thermal Piezoresponse H-BN Pinpoint PFM Silicon LiquidImaging Polydimethylsiloxane Roughness Logo LFM Lateral_Force_Microscopy cannabinoid Sphere Austenite Molybdenum_disulfide Potential Layer Sidewall organic_polymer InorganicCompound INSP SiWafer China Polystyrene Optic Nanopattern StrontiumTitanate Tin disulfide 3-hexylthiophene Inorganic Sapphire LiBattery PVAP3HT temperature controller AFM Chemical Vapor Deposition
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256