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Workfunction contact LiquidCrystal LiIonBattery PinpointNanomechanicalMode OpticalWaveguide MolybdenumDisulfide FrictionalForce CHRYSALIS_INC semifluorinated_alkanes Platinum LaAlO3 Graphene atomic_steps CP-AFM Semiconductor fluoroaalkane Fe_film dielectric trench Melt KPFM Polyethylene LateralPFM SThM doped GaP hard_disk_media Ferroelectric AtomicLayer Polyurethane UnivOfMaryland FM_KPFM SicMosfet polymeric_arrays NiFe
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V