-
PS_LDPE StrontiumTitanate PolycrystallineFerroelectricBCZT Materials Polystyrene Yttria_stabilized_Zirconia Glass Modulus SingleLayer Boron Nickel ChemicalCompound ThermalDetectors MoS2 Growth Cobalt non_contact Singapore CeNSE_IISc Heating PFM PVAC temp_control Granada Polyvinylidene_fluoride CNT doped IISCBangalore PyroelectricDetector bias_mode LiquidCell Temasek_Lab Aluminum AM-KPFM Sadowski
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126