C-AFM即导电原子力显微镜在测量纳米尺度样品形貌同时可获得样品的电学特性,例如半导体器件,复合材料,纳米纤维等等。利用原子力的高精度定位,可针对感兴趣区域进行I-V特性研究。该讲座还介绍了C-AFM的不同类型样品的制备和探针种类的选择与推荐。C-AFM是基于原子力contact 模式,在其样品形貌反馈基础上,增加了电流放大器等模块形成样品与探针的电学接触回路。详细介绍了对于样品测试时电流放大器Gain增益,setpoint 和 scan rate参数优化。
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