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  • Welcome from the Editor
  • NanoScientific Interview
  • Characterization of 2D materials by imaging spectroscopic ellipsometry (ISE)
  • Functional polymeric passivation-led improvement of bias stress with long-term durability of edge-rich nanoporous MoS2 thin-film transistors
  • How to tailor the crystallographic orientation evolution and surface morphological features of polycrystalline conductive N-type ZnO films
  • NanoScientific Interview
  • Surface potential characterization of two-dimensional materials through back-gate voltage biases
  • Mapping the registry and functional properties of layered materials heterostructures using conductive atomic force microscopy
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