NANOscientific Magazine, Spring 2023

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LINK 1: NANOscientific Magazine Spring 2023

Welcome from the Editor
NanoScientific Interview
Characterization of 2D materials by imaging spectroscopic ellipsometry (ISE)
Functional polymeric passivation-led improvement of bias stress with long-term durability of edge-rich nanoporous MoS₂ thin-film transistors
How to tailor the crystallographic orientation evolution and surface morphological features of polycrystalline conductive N-type ZnO films
NanoScientific Interview
Surface potential characterization of two-dimensional materials through back-gate voltage biases
Mapping the registry and functional properties of layered materials heterostructures using conductive atomic force microscopy
Park Systems News

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