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  • Magnetic Nanoscavengers: The New Trend to Improve Water Qualit
  • Contact AFM Nanolithography Based on Anodic Oxidation
  • High resolution imaging of single PTFE molecules on Teflon surface
  • Application-specific characterizations and analyses of carbon-based materials utilizing different microscopic technologies
  • Improved Electrical Characterization of Advanced Materials in High Vacuum Environment
  • Quantifying Epitaxial Growth using a Purely Topographical Signal
  • A Comparative Study of Atomic Force Microscopy between AM-KPFM and Sideband KPFM

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