In this webinar the principle of electrostatic force microscopy (EFM) will be discussed to map electrical properties of the sample by sensing the electrostatic force between the tip and the sample. The images obtained from EFM or rather Kelvin probe force microscopy (KPFM) reveal the surface potential or distribution of surface charges of the sample surface at nanometer scale as well as map the work functions of the materials along with the topographical information. The electrostatic force gives the information of the electrical signals and the van der Waals forces give the topography of the sample surface. We shall discuss the two main approaches to decouple the electrostatic and van der Waals forces viz. the lift mode and dual frequency EFM along with the instrumentation setup using Park System AFM.