原子力显微镜AFM是在纳米尺度上表征样品形貌的最主要的方法之一,基于样品形貌同时还可选择不同模块研究其电学,磁学,热学,电化学,力学等特性。然而样品制备的合适与否决定了样品形貌及其他特性的准确性。本讲座主要介绍不同类型的样品制备过程及注意点,包括粉末,纤维,电学模块样品等等。样品的制备是所有实验的基础,尤其是AFM样品的形貌测试,不同类型,尺寸及状态的样品的制备好坏决定测试结果是否能真实表征样品的特征结构和尺寸,排除由于样品制备不当导致的样品扭曲,虚像或图像失真。对于同一类型样品,不同制备样品的方式也比较了其优缺点及适用范围。希望讲座可以给大家在实际样品制备带来一些指引。
- Products & Solutions
- AFM for Research and Surface Analysis
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- AFM for In-line Metrology
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Surface Inspection Metrology
- Ellipsometry Accessories
- Applications
- Services
- Events
- Company
- Learning Center
- NANOacademy
- Lectures
- How AFM Works
- Expert Corner
- Analyze Cells
- Programs
- Park AFM Scholarship
- Products & Solutions
- AFM for Research and Surface Analysis
- AFM for In-line Metrology
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- Applications
- Services
- Events
- Company
- Investors
- Learning Center
- NANOacademy
- Programs
- Resources
Copyright © 2024 Park Systems. All Rights Reserved.