Atomic Force Microscope (AFM) measure the surface topography and other physical properties of the samples with sub-nanometer resolution giving three dimensional images. AFMs therefore have become an indispensable tool in industrial and research applications. The conventional AFM users may take long time to setup an experiment as it includes several steps to be performed before the user gets insightful data. So, the AFM seems to have complex operations and handling as seeing by an unexperienced user which pose an important question: “Is AFM easy to use?”.

In this webinar and system demonstration, we would like to answer the above question affirmatively by introducing Park FX 40: The automatic AFM which infuses artificial intelligence and machine learning for auto probe identification, auto probe exchange, auto beam alignment, automatic tip approach and sample navigation controlled using the SmartScan software which eases the use of AFM for busy researchers who need highest resolution images and nanoscale measurements.