Monday, 31 Jan 2022
-
12:00 pm
(ARAB)
Riyadh -
2:30 pm
(IST)
New Delhi -
5:00 pm
(SST)
Singapore -
8:00 pm
(AEDT)
Sydney
Atomic Force Microscope (AFM) is a technique which belongs to the
Scanning Probe Microscopy (SPM) family. It visualizes and generates
images by ‘feeling’ the surface of the sample. The main operation
modes of AFM depend on the force range due to the tip-sample
separation distance. The AFM operates basically in three modes i.e.
contact mode, intermittent contact or tapping mode and non-contact
mode. In contact mode of operation of AFM the cantilever is in contact
with the sample surface. The interaction between the cantilever and
the sample surface is in the repulsive regime. In non-contact mode the
tip does not come in contact with the surface of the sample and the
tip – sample distance is generally of the order of few tens of
nanometers and the tip experiences long range attractive forces.
Therefore, tip and sample can be preserved. Tapping mode (i.e.,
intermittent contact mode) shares similar principle with non-contact
mode. AFMs have been widely used in various applications of diverse
fields ranging from surface sciences, biology, chemistry and so on.
The target of this session is to understand the interaction between
the tip and the specimen surface while mapping sample surface.
Presented By :
Dr. Ashutosh Valavade
Application Scientist, Park Systems
India
Dr. Ashutosh Valavade is an Application Scientist for Park Systems India and has a high level of experience in handling materials science & biological Atomic Force Microscopes (AFM). He has completed his doctorate from University of Mumbai.