Interactive session will consist of demonstrating nanoindentation process (Set point & Z height). Differences in the result analysis will be explained. Demonstration sample will be a polycarbonate film. Questions are welcomed at any time during the session.
- Products & Solutions
- AFM for Research and Surface Analysis
- Small Sample AFM
- Large Sample AFM
- Vacuum Environment AFM
- AFM Probes and Options
- AFM Modes and Techniques
- AFM for In-line Metrology
- AFM for Wafer Fabs
- AFM for Flat Panel Display
- Photomask Repair
- Optical Profilometry
- Nano Infrared Spectroscopy
- Ellipsometry for Thin Film Characterization
- Imaging Spectroscopic Ellipsometry
- Referenced Spectroscopic Ellipsometry
- Brewster Angle Microscopy
- Surface Inspection Metrology
- Ellipsometry Accessories
- Applications
- Services
- Events
- Company
- Learning Center
- NANOacademy
- Lectures
- How AFM Works
- Expert Corner
- Analyze Cells
- Programs
- Park AFM Scholarship
- Products & Solutions
- AFM for Research and Surface Analysis
- AFM for In-line Metrology
- Ellipsometry for Thin Film Characterization
- Active Vibration Isolation
- Software
- Applications
- Services
- Events
- Company
- Investors
- Learning Center
- NANOacademy
- Programs
- Resources
Copyright © 2024 Park Systems. All Rights Reserved.