Park AFM Webinar - Q1, 2013
System Requirements for Webinar PC-based attendees Macintosh®-based attendees Enabling nanoscale advances Please join us for two interactive Park AFM webinar sessions to learn more about the breaking technologies at Park Systems. Part1Park NX20: The Most Accurate AFM for Failure Analysis (FA) & Quality Assurance (QA) Part2Park SICM: Single Live Cell Imaging With Park Scanning Ion Conductance Microscopy The second session will cover the technology of single live cell imaging with Park scanning probe microscopy. Do not miss these great opportunities to meet the technical experts from Park during the webinar session. At the end of the presentation, you will have an opportunity to ask questions you may have specific to your application. Register now for a session by clicking on the date you wish to attend:
Upon your registration, you will receive a confirmation email with the login details. For any questions, please contact matt.shin@parkAFM.com |