FMM / F-d / PinPoint
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
| Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
|---|---|---|---|
| PPP-FMR (10ea.) | |||
| 610-1110 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~2 N/m, f = ~75 kHz |
Mounted Type | 591,000 |
| 610-0110 | Unmounted Type | 461,000 | |
| DT-FMR (10ea.) | |||
| 610-1077 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating ▪ Diamond coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~6.2 N/m, f = ~105 kHz |
Mounted Type | 1,887,000 |
| 610-0077 | Unmounted Type | 1,692,000 | |
| PPP-NCSTR (10ea.) | |||
| 610-1117 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflex coating (Al) ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <10 nm ▪ k = ~7.4 N/m, f = ~160 kHz |
Mounted Type | 591,000 |
| 610-0117 |
Unmounted Type | 461,000 | |
| NSC36/Al BS (10ea.) | |||
| 610-1001 | ▪ Contact cantilever ▪ Backside reflective coating (Al) ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <8 nm ▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz ▪ 3 cantilevers on a chip |
Mounted Type | 416,000 |
| 610-0001 |
Unmounted Type | 286,000 | |
| NSC14/Hard/Al BS (10ea.) | |||
| 610-1140 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Al) ▪ Hard Diamond-Like-Carbon coated tip ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <20 nm ▪ k = ~5 N/m, f = ~160 kHz |
Mounted Type | 507,000 |
| 610-0140 |
Unmounted Type | 377,000 | |
| SD-R30-CONT (10ea.) | |||
| 610-1230 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~0.2 N/m, f = ~13 kHz |
Mounted Type | 856,000 |
| 610-0230 | Unmounted Type | 778,000 | |
| SD-R30-FM (10ea.) | |||
| 610-1229 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 856,000 |
| 610-0229 | Unmounted Type | 778,000 | |
| SD-R30-NCH (10ea.) | |||
| 610-1228 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: ~30 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 856,000 |
| 610-0228 | Unmounted Type | 778,000 | |
| MSS-Soft (5ea.) | |||
| 610-1254 | ▪ Cantilever for PinPoint nanomechanical mode and force spectroscopy ▪ Tip shape: Conical ▪ Tip tilt compensation: 13° ▪ Typical spike length: ~250 nm ▪ Typical tip radius: <2 nm ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,847,000 |
| 610-0254 | Unmounted Type | 1,782,000 | |
| SSS-FMR (10ea.) | |||
| 610-1245 | ▪ Cantilever with force constant suitable for FMM with super sharp tip ▪ Backside reflex coating (Al) ▪ Typical tip radius: 2 nm (< 5 nm) ▪ k = ~2.8 N/m, f = ~75 kHz |
Mounted Type | 1,277,000 |
| 610-0245 | Unmounted Type | 1,083,000 | |
| NSC19/Cr-Au (10ea.) | |||
| 610-1234 | ▪ Cantilever with force constant suitable for FMM ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~0.5 N/m, f = ~65 kHz |
Mounted Type | 474,000 |
| 610-0234 | Unmounted Type | 345,000 |
Contact