Conductive AFM / VECA / ULCA
당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오.
아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.
| Part Num. | Model / Description | 한국판매가 (단위:원) 부가세 별도 |
|
|---|---|---|---|
| CDT-CONTR_T (10ea.), CDT-CONTR (10ea.) | |||
| 610-1135-01 | ▪ Contact cantilever for conductive AFM ▪ Backside reflex coating (Al) ▪ Electrically conductive diamond-coated tip ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: 100 - 200 nm ▪ k = ~0.5 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 2,373,000 |
| 610-0135 | Unmounted Type | 2,114,000 | |
| PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.) | |||
| 610-1073-01 | ▪ Probe for DC-EFM/PFM/C-AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PtIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~25 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 863,000 |
| 610-0073 | Unmounted Type | 642,000 | |
| 25Pt300B_T (10ea.), 25Pt300B (10ea.) | |||
| 610-1115-01 |
▪ Contact cantilever for conductive AFM (C-AFM)/SCM ▪ Solid platinum probe tip and cantilever ▪ Typical tip length: ~80 μm ▪ Typical tip radius: <20 nm ▪ k = ~18 N/m, f = ~20 kHz ▪ Mounted type on Teflon-coated chip carrier ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
Mounted Type | 1,401,000 |
| 610-0115 |
Unmounted Type | 1,142,000 | |
| NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.) | |||
| 610-1023-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflective coating (Au) ▪ Conductive tip for electrical application, coated with Cr-Au ▪ Typical tip length: 12 - 18 μm ▪ Typical tip radius: <35 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on Teflon-coated chip carrier |
Mounted Type | 564,000 |
| 610-0023 |
Unmounted Type | 345,000 | |
| PPP-EFM_C (10ea.), PPP-EFM (10ea.) | |||
| 610-1023-01 |
▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-PtIr5) ▪ Conductive tip for electrical application, coated with Cr-PrIr5 ▪ Typical tip length: 10 - 15 μm ▪ Typical tip radius: <25 nm ▪ k = ~2.8 N/m, f = ~75 kHz ▪ Mounted type on ceramic chip carrier ▪ Unmounted type required for clip type probehand |
Mounted Type | 772,000 |
| 610-0023 |
Unmounted Type | 642,000 | |
| ElectriMulti75-G (10ea.) | |||
| 610-1098-01 |
▪ Probe for Conductive AFM ▪ Backside reflective coating (Cr-Pt) ▪ Tip shape: Rotated ▪ Conductive tip for electrical application, coated with Cr-Pt ▪ Typical tip length: ~7 μm ▪ Typical tip radius: <25 nm ▪ k = ~3 N/m, f = ~75 kHz |
Mounted Type | 564,000 |
| 610-0098 |
Unmounted Type | 345,000 | |
| PtSi-CONT_T (10ea.), PtSi-CONT (10ea.) | |||
| 610-1121-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Platinum silicide coating on both sides of the cantilever ▪ Typical tip length: ~ 12.5 μm ▪ Typical tip radius: <25 nm ▪ k = ~0.2 N/m, f = ~13 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,373,000 |
| 610-0121 |
Unmounted Type | 2,114,000 | |
| AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.) | |||
| 605-1264-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
| 605-0264 |
Unmounted Type | 1,284,000 | |
| AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.) | |||
| 605-1266-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~2.8 N/m, f = ~65 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
| 605-0266 |
Unmounted Type | 1,925,000 | |
| AD-40-AS_T (5ea.), AD-40-AS (5ea.) | |||
| 605-1265-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: ~10 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 1,544,000 |
| 605-0265 |
Unmounted Type | 1,284,000 | |
| AD-40-SS_T (5ea.), AD-40-SS (5ea.) | |||
| 605-1267-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Single crystal electrically conductive diamond coated tip ▪ Typical tip length: ~ 300 nm ▪ Typical tip radius: <5 nm ▪ k = ~40 N/m, f = ~180 kHz ▪ Mounted type on teflon-coated chip carrier |
Mounted Type | 2,184,000 |
| 605-0267 |
Unmounted Type | 1,925,000 | |
| PtSi-NCH_T (10ea.), PtSi-NCH (10ea.) | |||
| 610-1084-01 |
▪ Contact cantilever for conductive AFM (C-AFM) ▪ Backside reflex coating (PtSi) ▪ Conductive tip for electrical application, coated with PtSi ▪ Tip shape: 4-sided pyramidal ▪ Typical tip length: 12.5 μm ▪ Typical tip radius: ~25 nm ▪ k = ~42 N/m, f = ~330 kHz |
Mounted Type | 2,373,000 |
| 605-0038 |
Unmounted Type | 2,114,000 |
psk@parksystems.com
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